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Characterization is an important part of materials selection and development. Research is increasingly intensifying in nano and sub-micron dimensions, be it particle size or patterns. X-ray diffraction can be used to extract information across a wide range of length scales including nano and micron dimensions. Two of the commonly used x-ray diffraction/scattering techniques are small angle x-ray scattering (SAXS) and wide angle x-ray scattering (WAXS). Often these techniques serve as source of complementary information but prove to be equally powerful when used independently. This workshop aims to introduce basics of x-ray diffraction and scattering, followed by principles and usage of SAXS and WAXS along with their applications. Some of the applications include nanostructure analysis (shape, size and internal structure), porosity (specific surface), crystallinity and orientation. The workshop also provides introductory hands-on training for these techniques.

NOTE: The number of seats are limited to 20. Therefore kindly register at the earliest. The registration opens on 2nd November and closes on 30th November.